The X-Strata 960+ is an XRF (X-Ray Fluorescence) analyzer from Oxford Instruments that the EMPF has in the demonstration factory.  The primary use of this instrument is to measure the thickness and/or composition of plating, coatings, and films containing elements from Titanium through Uranium. 

The Oxford XRF is an invaluable tool for providing a quick and thorough composition analysis of up to 15 elements simultaneously.  It can be used to confirm the absence or presence of lead in “lead free” parts.  This is an indispensable feature considering all the counterfeit electronic components finding their way into the US supply chain*.  Often, XRF instruments have the capability to scan entire PC boards and generate an elemental composition map of all components present, while at the same time, measure coating thickness, plating, and film. 

The material analysis it performs is non-destructive and provides results in a matter of seconds or minutes.  This is another important factor for quality assurance and in-coming inspection and can save time and money when component defects and material inconsistencies are present in a single tray or tube.

The X-Strata is very easy to operate with minimal set up calibrations.  It features automatic spectrum calibrations, a small spot size with a very large sample tray area.  This sample area features a unique one-click laser alignment system which automatically finds the correct focal distance.  This feature improves the focusing process for the DIM (Distance Independent Measurement), improves system reproducibility, and gains clarity and accuracy for the overall X-ray image. Some optional capabilities of the Oxford X-Strata 960+ are automated laser focusing, advanced data export and integrated computer and monitor for improved user interface.

For more information related to this article, or to schedule a demonstration of the Oxford X-Strata 960 located at the EMPF, contact Ken Friedman, 610-362-1200 x 279 or via email at kfriedman@aciusa.org

* The EMPF performs a full analysis of suspected counterfeit components.  Please see the website www.aciusa.org for details.