A publication of the National Electronics Manufacturing Center of Excellence
September 2009
ACI EMPF

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ACI Technologies Inc.
One International Plaza
Suite 600
Philadelphia, PA 19113
(610) 362-1200
FAX: (610) 362-1290
HELPLINE: (610) 362-1320
WEBSITE: www.empf.org
www.aciusa.org

The EMPF is a U.S. Navy-sponsored National
Electronics Manufacturing Center of Excellence focused on the development, application, and transfer of new electronics manufacturing technology by partnering with industry, academia, and government centers and laboratories in the U.S

Michael D. Frederickson
EMPF Director

Barry Thaler, PhD., bthaler@aciusa.org
EMPF Technical Editor



In This Issue

Advanced Packaging of SMTAssemblies for Greater Cost Reduction

 

Ask the EMPF Helpline!

 

Fixturing for Selective Soldering

 

Tech Tips: Battery Selection

 

Manufacturer’s Corner: KIC

 

Electronics Manufacturing Boot Camp

 

EMTC Online Registration

 

Upcoming Training Center Courses

IAB
Industrial Advisory Board
Gerald R. Aschoff, The Boeing Company
Dennis M. Kox, Raytheon
Gregory X. Krieger, BAE Systems
Edward A. Morris, Lockheed Martin
Jack R. Harris, Rockwell Collins
Gary Kirchner, Honeywell
Andrew Paradise, Northrop Grumman
Richard Kidwell , ITT Industries


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title

In today’s complex manufacturing environments, a great deal of thought is given to the lean concepts of day-to-day production. Although lean manufacturing techniques are reducing process costs, growing electricity prices are increasing manufacturing costs overall.

Developing the most accurate reflow thermal profiles is a critical component of long term cost savings and production accuracy. Using a thermal profiler is the first step in this process. The thermal profiler measures the time and temperature as the product travels through the reflow oven. The data acquired typically includes statistics such as peak temperature, soak, time above liquidus, and more. This profile is crucial for understanding the “success” of the thermal process relative to the factors that limit the process (i.e., the process window).

The Explorer is a new generation of thermal profiler from KIC (Figure 5-1). It features a very compact design which will easily move through the restrictive process dimensions encountered in today’s thermal applications. It incorporates state-of-the-art surface mount technology (SMT) components and the high-temperature rated components that are necessary to endure the harsh conditions of real-world factory use. KIC’s thermal profilers measure all relevant data of the process. By combining this data into a matrix, a process window is defined to assure product reliability. The closer to the center of this window, the more robust the process profile, and the lower the Process Window Index (PWI). This unique and vital statistic measures how well the actual product profile matches the established process window. The PWI not only helps ensure correct wetting and cooling, but will help reduce long-term energy costs.

Studies have been conducted at numerous electronics manufacturing facilities to observe the effect of power use on varying reflow oven settings. The KIC profilers were key to these investigations. It was theorized that by reducing the heat and increasing the dwell time in each zone of the oven, considerable energy can be saved. This may seem counter-intuitive to the standard profile of using higher reflow temperatures for shorter times; however, the average reflow oven has many alternative recipes that can produce a correct profile. In fact, for any given application, a number of these recipes are capable of processing the product within specification. But the manual setup and investigation of many profiles is very slow and expensive. Software tools are now available to automate process optimization using modern simulation algorithms. Even optimizing on low power consumption can now be performed. The KIC tools can consider millions of available recipes and select the appropriate oven setup that yields the lowest energy use, all within seconds.

The profiling expertise of the KIC Explore is a valuable tool, not only to find the perfect thermal recipe, but also as a means to cut wasted energy and production costs.
For more information related to this article, or to schedule a demonstration of the KIC thermal profiler located at the EMPF, contact Ken Friedman at 610.362.1200, extension 279 or via email at kfriedman@aciusa.org.


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